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dc.provenanceCONICET-
dc.creatorMiguel, María de la Paz-
dc.creatorTomba, Juan Pablo-
dc.date2018-08-03T14:23:12Z-
dc.date2018-08-03T14:23:12Z-
dc.date2012-05-
dc.date2018-07-11T17:25:34Z-
dc.date.accessioned2019-04-29T15:37:54Z-
dc.date.available2019-04-29T15:37:54Z-
dc.date.issued2012-05-
dc.identifierMiguel, María de la Paz; Tomba, Juan Pablo; A comparison of different approaches for depth profiling of films and coatings by confocal Raman microscopy; Elsevier Science Sa; Propress In Organic Coatings; 74; 1; 5-2012; 43-49-
dc.identifier0300-9440-
dc.identifierhttp://hdl.handle.net/11336/54043-
dc.identifierCONICET Digital-
dc.identifierCONICET-
dc.identifier.urihttp://rodna.bn.gov.ar:8080/jspui/handle/bnmm/298110-
dc.descriptionWe compare and analyze different approaches to perform depth profiling of polymer films and coatings by confocal Raman microscopy (CRM). Data were generated using three methodologies: conventional metallurgical objectives, oil-immersion optics and numerical post processing of the as-measured intensity profiles, via an optimized deconvolution technique adapted to CRM. A series of bi- and multi-layered polymeric films were used as test systems. Strengths and weaknesses of each methodology are evaluated in terms of delivered depth resolution, signal throughput and flexibility. It is shown that the application of regularized deconvolution on data obtained from dry objectives yielded intensity profiles with a quality comparable, in some cases superior, to those obtained with immersion objectives, with the advantage of being totally non-invasive. © 2011 Elsevier B.V. All Rights Reserved.-
dc.descriptionFil: Miguel, María de la Paz. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Mar del Plata. Instituto de Investigaciones en Ciencia y Tecnología de Materiales. Universidad Nacional de Mar del Plata. Facultad de Ingeniería. Instituto de Investigaciones en Ciencia y Tecnología de Materiales; Argentina-
dc.descriptionFil: Tomba, Juan Pablo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Mar del Plata. Instituto de Investigaciones en Ciencia y Tecnología de Materiales. Universidad Nacional de Mar del Plata. Facultad de Ingeniería. Instituto de Investigaciones en Ciencia y Tecnología de Materiales; Argentina-
dc.formatapplication/pdf-
dc.formatapplication/pdf-
dc.languageeng-
dc.publisherElsevier Science Sa-
dc.relationinfo:eu-repo/semantics/altIdentifier/doi/https://dx.doi.org/10.1016/j.porgcoat.2011.09.016-
dc.relationinfo:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/pii/S030094401100289X-
dc.rightsinfo:eu-repo/semantics/restrictedAccess-
dc.rightshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/-
dc.sourcereponame:CONICET Digital (CONICET)-
dc.sourceinstname:Consejo Nacional de Investigaciones Científicas y Técnicas-
dc.sourceinstacron:CONICET-
dc.source.urihttp://hdl.handle.net/11336/54043-
dc.subjectCONFOCAL RAMAN MICROSCOPY-
dc.subjectDECONVOLUTION-
dc.subjectDEPTH PROFILING-
dc.subjectPOLYMER FILMS AND COATINGS-
dc.subjectRecubrimientos y Películas-
dc.subjectIngeniería de los Materiales-
dc.subjectINGENIERÍAS Y TECNOLOGÍAS-
dc.titleA comparison of different approaches for depth profiling of films and coatings by confocal Raman microscopy-
dc.typeinfo:eu-repo/semantics/article-
dc.typeinfo:eu-repo/semantics/publishedVersion-
dc.typeinfo:ar-repo/semantics/articulo-
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