1. RODNA
  2. CONICET
  3. CONICET
Registro completo de metadatos
Campo DC Valor Lengua/Idioma
dc.creatorGovyadinov, Alexander A.-
dc.creatorMastel, Stefan-
dc.creatorGolmar, Federico-
dc.creatorChuvilin, Andrey-
dc.creatorCarney, P. Scott-
dc.creatorHillenbrand, Rainer-
dc.date2018-01-17T20:45:08Z-
dc.date2018-01-17T20:45:08Z-
dc.date2014-06-
dc.date2018-01-16T18:01:53Z-
dc.date.accessioned2019-04-29T15:27:19Z-
dc.date.available2019-04-29T15:27:19Z-
dc.date.issued2018-01-17T20:45:08Z-
dc.date.issued2018-01-17T20:45:08Z-
dc.date.issued2014-06-
dc.date.issued2018-01-16T18:01:53Z-
dc.identifierChuvilin, Andrey; Golmar, Federico; Hillenbrand, Rainer; Govyadinov, Alexander A.; Mastel, Stefan; Carney, P. Scott; et al.; Recovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography; American Chemical Society; ACS Nano; 8; 7; 6-2014; 6911-6921-
dc.identifier1936-0851-
dc.identifierhttp://hdl.handle.net/11336/33709-
dc.identifierCONICET Digital-
dc.identifierCONICET-
dc.identifier.urihttp://rodna.bn.gov.ar:8080/jspui/handle/bnmm/294467-
dc.descriptionThe increasing complexity of composite materials structured on the nanometer scale requires highly sensitive analytical tools for nanoscale chemical identification, ideally in three dimensions. While infrared near-field microscopy provides high chemical sensitivity and nanoscopic spatial resolution in two dimensions, the quantitative extraction of material properties of three-dimensionally structured samples has not been achieved yet. Here we introduce a method to perform rapid recovery of the thickness and permittivity of simple 3D structures, such as thin films and nanostructures from near-field measurements, and provide its first experimental demonstration. This is accomplished via a novel nonlinear invertible model of the imaging process, taking advantage of the near-field data recorded at multiple harmonics of the oscillation frequency of the near-field probe. Our work enables the quantitative nanoscale-resolved optical studies of thin films, coatings, and functionalization layers, as well as the structural analysis of multiphase materials, among others. It represents a major step toward the further goal of a general near-field tomography of samples.-
dc.descriptionFil: Govyadinov, Alexander A.. CIC nanoGUNE; España-
dc.descriptionFil: Mastel, Stefan. CIC nanoGUNE; España-
dc.descriptionFil: Golmar, Federico. CIC nanoGUNE; España. Instituto Nacional de Tecnología Industrial; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina-
dc.descriptionFil: Chuvilin, Andrey. CIC nanoGUNE; España. Fundación Vasca para la Ciencia; España-
dc.descriptionFil: Carney, P. Scott. University of Illinois at Urbana; Estados Unidos-
dc.descriptionFil: Hillenbrand, Rainer. CIC nanoGUNE; España. Universidad del País Vasco; España-
dc.formatapplication/pdf-
dc.formatapplication/pdf-
dc.languageeng-
dc.publisherAmerican Chemical Society-
dc.relationinfo:eu-repo/semantics/altIdentifier/url/http://pubs.acs.org/doi/abs/10.1021/nn5016314-
dc.relationinfo:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1021/nn5016314-
dc.rightsinfo:eu-repo/semantics/restrictedAccess-
dc.rightshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/-
dc.sourcereponame:CONICET Digital (CONICET)-
dc.sourceinstname:Consejo Nacional de Investigaciones Científicas y Técnicas-
dc.sourceinstacron:CONICET-
dc.subjectChemical imaging-
dc.subjectNanotomography-
dc.subjectInverse problems-
dc.subjectNear-field microscopy-
dc.subjects-SNOM-
dc.subjectThin films-
dc.subjectAstronomía-
dc.subjectCiencias Físicas-
dc.subjectCIENCIAS NATURALES Y EXACTAS-
dc.titleRecovery of Permittivity and Depth from Near-Field Data as a Step toward Optical Nanotomography-
dc.typeinfo:eu-repo/semantics/article-
dc.typeinfo:eu-repo/semantics/publishedVersion-
dc.typeinfo:ar-repo/semantics/articulo-
Aparece en las colecciones: CONICET

Ficheros en este ítem:
No hay ficheros asociados a este ítem.
Mostrar el registro sencillo del ítem